Characterization of chlorine doped SrS thin films by SIMS, RBS and XRF

S. Lehto; R. Lappalainen; J. Likonen; L. Niinistö; P. Soininen

Characterization of chlorine doped SrS thin films by SIMS, RBS and XRF

S. Lehto
, R. Lappalainen
, J. Likonen
, L. Niinistö
, P. Soininen

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	Euroanalysis VIII, Edinburgh, 5.-12.9.1993
Place of Publication	Edinburgh
Pages	LF5
Publication status	Published - 1993
MoE publication type	A4 Conference publication

Keywords

chlorine
RBS
secondary ion mass spectroscopy (SIMS)
thin films
XRF

Cite this

@inproceedings{0bbcb9e147ce4ce99a4dc017b541e07c,

title = "Characterization of chlorine doped SrS thin films by SIMS, RBS and XRF",

keywords = "chlorine, RBS, secondary ion mass spectroscopy (SIMS), thin films, XRF, chlorine, RBS, secondary ion mass spectroscopy (SIMS), thin films, XRF, chlorine, RBS, secondary ion mass spectroscopy (SIMS), thin films, XRF",

author = "S. Lehto and R. Lappalainen and J. Likonen and L. Niinist{\"o} and P. Soininen",

year = "1993",

language = "English",

pages = "LF5",

booktitle = "Euroanalysis VIII, Edinburgh, 5.-12.9.1993",

}

TY - GEN

T1 - Characterization of chlorine doped SrS thin films by SIMS, RBS and XRF

AU - Lehto, S.

AU - Lappalainen, R.

AU - Likonen, J.

AU - Niinistö, L.

AU - Soininen, P.

PY - 1993

Y1 - 1993

KW - chlorine

KW - RBS

KW - secondary ion mass spectroscopy (SIMS)

KW - thin films

KW - XRF

KW - chlorine

KW - RBS

KW - secondary ion mass spectroscopy (SIMS)

KW - thin films

KW - XRF

KW - chlorine

KW - RBS

KW - secondary ion mass spectroscopy (SIMS)

KW - thin films

KW - XRF

M3 - Conference article in proceedings

SP - LF5

BT - Euroanalysis VIII, Edinburgh, 5.-12.9.1993

CY - Edinburgh

ER -