Characterization of a poly(3-methyl thiophene) film by an in-situ dc resistance measurement technique and in-situ FTIR spectroelectrochemistry

E. Lankinen, G. Sundholm, P. Talonen, Timo Laitinen, T. Saario

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)135-145
    JournalJournal of Electroanalytical Chemistry
    Volume447
    Publication statusPublished - 1998
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Contact electric resistance (CER) technique
    • In-situ dc resistance measurement technique
    • In-situ external reflectance FTIR spectroscopy
    • Poly(3 methyl thiophene) film

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