@techreport{bf7697f788cc45c4ba18ca8acfe837a5,
title = "Calibration of Test Fixtures Using at Least Two Standards",
keywords = "calibration, microwave measurements, network analyzer, scattering parameters, calibration, microwave measurements, network analyzer, scattering parameters, calibration, microwave measurements, network analyzer, scattering parameters",
author = "K. Silvonen",
year = "1991",
language = "English",
series = "Circuit Theory Laboratory Report Series",
publisher = "Helsinki University of Technology, Circuit Theory Laboratory",
number = "CT-5",
pages = "8",
type = "WorkingPaper",
institution = "Helsinki University of Technology, Circuit Theory Laboratory",
}