Calibration and De-Embedding of Microwave Measurements using any Combination of One- or Two-Port Standards

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationEspoo
    Publication statusPublished - 1987
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameCircuit Theory Laboratory Report Series
    PublisherHelsinki University of Technology, Circuit Theory Laboratory
    ISSN (Print)0784-5979


    • calibration
    • de-embedding
    • microwave measurements
    • scattering parameters

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