Abstract
We perform fully bipolar Monte Carlo simulations of electrons and holes in III-Nitride multi-quantum well light-emitting diodes (LEDs) to investigate the effects of hot carriers. Our results show how accounting for hot carriers affects the current-voltage characteristics and device efficiency. We also discuss the effects of bandstructure details on the simulation results. Further simulations with versatile QW and EBL configurations are needed to confirm the relationship between hot carrier effects and current-voltage characteristics.
Original language | English |
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Title of host publication | Proceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD |
Publisher | IEEE |
Pages | 11-12 |
Number of pages | 2 |
Volume | 2015-May |
ISBN (Print) | 978-1-4799-8379-7 |
DOIs | |
Publication status | Published - 10 May 2015 |
MoE publication type | A4 Conference publication |
Event | International Conference on Numerical Simulation of Optoelectronic Devices - Taipei, Taiwan, Republic of China Duration: 7 Sept 2015 → 11 Sept 2015 Conference number: 15 |
Conference
Conference | International Conference on Numerical Simulation of Optoelectronic Devices |
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Abbreviated title | NUSOD |
Country/Territory | Taiwan, Republic of China |
City | Taipei |
Period | 07/09/2015 → 11/09/2015 |
Keywords
- Charge carrier processes
- Gallium nitride
- Hot carrier effects
- Light emitting diodes
- Monte Carlo methods
- Scattering