Bipolar Monte Carlo simulation of hot carriers in III-N LEDs

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Abstract

We perform fully bipolar Monte Carlo simulations of electrons and holes in III-Nitride multi-quantum well light-emitting diodes (LEDs) to investigate the effects of hot carriers. Our results show how accounting for hot carriers affects the current-voltage characteristics and device efficiency. We also discuss the effects of bandstructure details on the simulation results. Further simulations with versatile QW and EBL configurations are needed to confirm the relationship between hot carrier effects and current-voltage characteristics.

Original languageEnglish
Title of host publicationProceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD
PublisherIEEE Computer Society
Pages11-12
Number of pages2
Volume2015-May
ISBN (Print)978-1-4799-8379-7
DOIs
Publication statusPublished - 10 May 2015
MoE publication typeA4 Article in a conference publication
EventInternational Conference on Numerical Simulation of Optoelectronic Devices - Taipei, Taiwan, Republic of China
Duration: 7 Sep 201511 Sep 2015
Conference number: 15

Conference

ConferenceInternational Conference on Numerical Simulation of Optoelectronic Devices
Abbreviated title NUSOD
CountryTaiwan, Republic of China
CityTaipei
Period07/09/201511/09/2015

Keywords

  • Charge carrier processes
  • Gallium nitride
  • Hot carrier effects
  • Light emitting diodes
  • Monte Carlo methods
  • Scattering

Fingerprint Dive into the research topics of 'Bipolar Monte Carlo simulation of hot carriers in III-N LEDs'. Together they form a unique fingerprint.

  • Cite this

    Kivisaari, P., Sadi, T., Li, J., Georgiev, V., Oksanen, J., Rinke, P., & Tulkki, J. (2015). Bipolar Monte Carlo simulation of hot carriers in III-N LEDs. In Proceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD (Vol. 2015-May, pp. 11-12). [7292797] IEEE Computer Society. https://doi.org/10.1109/NUSOD.2015.7292797