Benchmarking for On-Scalp MEG Sensors

Minshu Xie, Justin F. Schneiderman*, Maxim L. Chukharkin, Alexei Kalabukhov, Bushra Riaz, Daniel Lundqvist, Stephen Whitmarsh, Matti Hämäläinen, Veikko Jousmäki, Robert Oostenveld, Dag Winkler

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

12 Citations (Scopus)

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Engineering & Materials Science