Bayesian Neural Network to Solve the Inverse Problem in Electrical Impedance Tomography

J. Lampinen, A. Vehtari, K. Leinonen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationSCIA´99, 11th Scandinavian donference on image analysis, June 7-11, Kangerlussuaq, Geenland
    EditorsB. K. Ersboll, P. Johansen
    Place of PublicationKangerlussuaq, Greenland
    PublisherThe Pattern Recognition society of Denmark
    Publication statusPublished - 1999
    MoE publication typeA4 Article in a conference publication


    • Bayesian methods
    • electrical impedance tomography
    • inverse problems
    • tomographic imaging

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