Bayesian approach for validation of runaway electron simulations

Aaro Järvinen, Tünde Fülöp, Eero Hirvijoki, Mathias Hoppe, Adam Kit, Jan Åström

Research output: Contribution to conferencePaperScientificpeer-review

Original languageEnglish
Publication statusPublished - 2022
MoE publication typeNot Eligible
EventRunaway Electron Modelling Meeting - Garching, Germany
Duration: 2 May 20226 May 2022
Conference number: 9

Conference

ConferenceRunaway Electron Modelling Meeting
Abbreviated titleREM
Country/TerritoryGermany
CityGarching
Period02/05/202206/05/2022

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