Back-reflection topographs of epitaxial laterally overgrown GaAs layers on Si substrate

R. Rantamäki, T. Tuomi, Z.R. Zytkiewicz, P.J. McNally, A.N. Danilewsky

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationHampuri
    Pages885-886
    Publication statusPublished - 2000
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameHASYLAB-DESY Annual Report 1999

    Keywords

    • gallium arsenide
    • silicon
    • synchrotron x-ray topography

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