Automatic observation of the dry line in paper machine

J. Berndtson, A.J. Niemi

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication13th International Conference on Pattern Recognition, Vienna, Austria, August 25-29, 1996
    EditorsM. E. Kavanaugh
    Place of PublicationLos Alamitos, California, USA
    PublisherIEEE Computer Society Press, International Association for Pattern Recognition
    PagesVol. III, pp. 308-312
    Publication statusPublished - 1996
    MoE publication typeA4 Article in a conference publication

    Keywords

    • CD control
    • dry line
    • edge detection
    • Fourdrinier paper machine
    • machine vision
    • MD control
    • wet end control

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