Automatic generation of repair suggestions for overall I&C architecture represented with an ontology

Polina Ovsiannikova*, Antti Pakonen, Valeriy Vyatkin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Abstract

We present an approach for suggesting possible fixes to an overall I&C nuclear architecture during its design phase. Despite the I&C architecture, in our case, being represented with an ontology, we do not aim to change the properties of an ontology per se. Instead, we focus on the subset of ABox triples that do not contain terminological elements in either subject, predicate, or object parts. Such a subset we call the design artifacts. When the ontology is filled with the design artifacts, the analyst runs the check of non-functional requirements using SPARQL queries. The requirements associated with the queries that returned results do not hold. The goal of the current work is to provide support for the next stage when the analyst has to change the design artifacts so that the queries no longer return results. Our method is based on representing the results of queries as graphs, intersecting them, and finding the minimal changes that prevent the results from being mapped on their (or other) queries.

Original languageEnglish
Title of host publication2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation, ETFA 2023
PublisherIEEE
Pages1-8
Number of pages8
ISBN (Electronic)979-8-3503-3991-8, 979-8-3503-3990-1
ISBN (Print)979-8-3503-3992-5
DOIs
Publication statusPublished - 2023
MoE publication typeA4 Conference publication
EventIEEE International Conference on Emerging Technologies and Factory Automation - Sinaia, Romania
Duration: 12 Sept 202315 Sept 2023

Publication series

NameIEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Volume2023-September
ISSN (Print)1946-0740
ISSN (Electronic)1946-0759

Conference

ConferenceIEEE International Conference on Emerging Technologies and Factory Automation
Abbreviated titleETFA
Country/TerritoryRomania
CitySinaia
Period12/09/202315/09/2023

Keywords

  • I&C architecture
  • non-functional requirements
  • ontology, design repair
  • safety-critical systems

Fingerprint

Dive into the research topics of 'Automatic generation of repair suggestions for overall I&C architecture represented with an ontology'. Together they form a unique fingerprint.

Cite this