Automatic Alignment of TEM Tilt-Series with and without Fiducial Markers

Sami Brandt, Jukka Heikkonen, Peter Engelhardt

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication53rd Annual Meeting of The Scandinavian Society for Electron Microscopy (SCANDEM 2002), Tampere, June 2002
    Pages66-67
    Publication statusPublished - 2002
    MoE publication typeA4 Article in a conference publication

    Keywords

    • automatic image alignment
    • TEM tomography

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