Atomic force microscopy on cross-sections of optical coatings: a new method

Angela Duparre, C. Ruppe, K. Pischow, M. Adamik, P.B. Barna

    Research output: Contribution to journalArticleScientificpeer-review

    15 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)70-75
    JournalThin Solid Films
    Issue number261
    Publication statusPublished - 1995
    MoE publication typeA1 Journal article-refereed

    Keywords

    • atomic force microscopy,
    • fluorine,optical coatings,
    • surface morphology

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