Application of in situ UV-vis spectroscopy and an in situ dc resistance measurement technique to the study of a poly(thiophene-3-methanol) film

E. Lankinen, M. Pohjakallio, Göran Sundholm, P. Talonen, Timo Laitinen, T. Saario

    Research output: Contribution to journalArticleScientificpeer-review

    32 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)167-174
    JournalJournal of Electroanalytical Chemistry
    Volume437
    Publication statusPublished - 1997
    MoE publication typeA1 Journal article-refereed

    Keywords

    • UV-VIS spectroscopy

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