Applicability of random and biased error models in uncertainty evaluation of photometer quality factor f1

Tuomas Poikonen, Petri Kärhä, Pasi Manninen, Farshid Manoocheri, Erkki Ikonen

Research output: Working paperProfessional

Original languageEnglish
Pages256
Publication statusPublished - 2009
MoE publication typeD4 Published development or research report or study

Publication series

NameThe XLIII annual conference of the Finnish Physical Society, Espoo, Finland, March 1214, 2009

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