Applicability of FTIR/PAS depth profiling for the study of coated papers

M. Halttunen, J. Tenhunen, T. Saarinen, P. Stenius

    Research output: Working paperProfessional

    28 Citations (Scopus)
    Original languageEnglish
    Pagess. P141
    Publication statusPublished - 1998
    MoE publication typeD4 Published development or research report or study

    Publication series

    Name2rd International Symposium on Advanced Infrared nad Raman spectorscopy, Wien, 5.­9.1998

    Keywords

    • depth profiling
    • FTIR-PAS

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