Anomalous Small-Angle X-ray Scattering

Ulla Vainio*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

Abstract

New nanomaterials being developed today have complex structures which cannot always be studied using traditional methods. Anomalous small-angle X-ray scattering is a noninvasive tool for the study of structures of individual elements inside the elaborately built nanostructures. This chapter discusses the basics of the method and provides approaches to tackle the inverse problem which complicates the data analysis.

Original languageEnglish
Title of host publicationNeutrons and Synchrotron Radiation in Engineering Materials Science: From Fundamentals to Applications: Second Edition
PublisherWILEY-VCH VERLAG
Pages217-225
Number of pages9
ISBN (Electronic)9783527684489
ISBN (Print)9783527335923
DOIs
Publication statusPublished - 27 Jan 2017
MoE publication typeA3 Part of a book or another research book

Keywords

  • Anomalous small-angle x-ray scattering
  • ASAXS
  • Contrast variation
  • Inverse problem
  • Nanostructure
  • Structural analysis

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