Analyzing GEM-foil properties with an optical scanning system

M. Kalliokoski; T. Hilden; F. Garcia; J. Heino; R. Lauhakangas; E. Tuominen; R. Turpeinen

doi:10.1088/1748-0221/7/02/C02059

Analyzing GEM-foil properties with an optical scanning system

M. Kalliokoski^*, T. Hilden, F. Garcia, J. Heino, R. Lauhakangas, E. Tuominen, R. Turpeinen

^*Corresponding author for this work

Not published at Aalto University

University of Helsinki

Research output: Contribution to journal › Article › Scientific › peer-review

2 Citations (Scopus)

Abstract

An optical scanning system was commissioned and further developed in the Detector Laboratory of Helsinki Institute of Physics and University of Helsinki. It was designed to automatically scan, perform on-line analysis and to classify the overall quality of GEM-foils especially of the GEM-TPC detectors for Super-FRS at FAIR. The optical scanning system consists of precision positioning table, lighting, optics and operating system with analysis software. It has active scanning area of 95 cm × 95 cm and it can study this area with a resolution of 1441 p/mm. In this paper the performance of the system is studied on different measurement tasks.

Original language	English
Article number	C02059
Journal	Journal of Instrumentation
Volume	7
Issue number	2
DOIs	https://doi.org/10.1088/1748-0221/7/02/C02059
Publication status	Published - 1 Feb 2012
MoE publication type	A1 Journal article-refereed

Keywords

Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)
Pattern recognition, cluster finding, calibration and fitting methods; Manufacturing; Detection of defects

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AU - Tuominen, E.

AU - Turpeinen, R.

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KW - Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)

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Analyzing GEM-foil properties with an optical scanning system

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