An optical scanning system was commissioned and further developed in the Detector Laboratory of Helsinki Institute of Physics and University of Helsinki. It was designed to automatically scan, perform on-line analysis and to classify the overall quality of GEM-foils especially of the GEM-TPC detectors for Super-FRS at FAIR. The optical scanning system consists of precision positioning table, lighting, optics and operating system with analysis software. It has active scanning area of 95 cm × 95 cm and it can study this area with a resolution of 1441 p/mm. In this paper the performance of the system is studied on different measurement tasks.
- Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)
- Pattern recognition, cluster finding, calibration and fitting methods; Manufacturing; Detection of defects