Analyzing GEM-foil properties with an optical scanning system

M. Kalliokoski*, T. Hilden, F. Garcia, J. Heino, R. Lauhakangas, E. Tuominen, R. Turpeinen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)


An optical scanning system was commissioned and further developed in the Detector Laboratory of Helsinki Institute of Physics and University of Helsinki. It was designed to automatically scan, perform on-line analysis and to classify the overall quality of GEM-foils especially of the GEM-TPC detectors for Super-FRS at FAIR. The optical scanning system consists of precision positioning table, lighting, optics and operating system with analysis software. It has active scanning area of 95 cm × 95 cm and it can study this area with a resolution of 1441 p/mm. In this paper the performance of the system is studied on different measurement tasks.

Original languageEnglish
Article numberC02059
JournalJournal of Instrumentation
Issue number2
Publication statusPublished - 1 Feb 2012
MoE publication typeA1 Journal article-refereed


  • Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)
  • Pattern recognition, cluster finding, calibration and fitting methods; Manufacturing; Detection of defects


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