Analytical characterization - a key for improved ALE-grown thin film structures for electroluminescent displays

Lauri Niinistö

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationThe 4th Baltic Symposium on Atomic Layer Epitaxy, Tartu, Estonia, October 10-11, 1997
    EditorsA. Rosental
    Place of PublicationTartto
    Pages8
    Publication statusPublished - 1997
    MoE publication typeA4 Article in a conference publication

    Keywords

    • atomic layer epitaxy
    • characterization
    • electroluminescent display
    • thin film

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