Analysis of threading dislocations in void shape controlled GaN re-grown on hexagonally patterned mask-less GaN

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Analysis of threading dislocations in void shape controlled GaN re-grown on hexagonally patterned mask-less GaN. / Ali, Muhammad; Romanov, A.E.; Suihkonen, Sami; Svensk, Olli; Sintonen, Sakari; Sopanen, Markku; Lipsanen, Harri; Nevedomsky, V.N.; Bert, N.A.; Odnoblyudov, M.A.; Bougrov, V.E.

In: Journal of Crystal Growth, Vol. 344, No. 1, 01.04.2012, p. 59-64.

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Ali, Muhammad ; Romanov, A.E. ; Suihkonen, Sami ; Svensk, Olli ; Sintonen, Sakari ; Sopanen, Markku ; Lipsanen, Harri ; Nevedomsky, V.N. ; Bert, N.A. ; Odnoblyudov, M.A. ; Bougrov, V.E. / Analysis of threading dislocations in void shape controlled GaN re-grown on hexagonally patterned mask-less GaN. In: Journal of Crystal Growth. 2012 ; Vol. 344, No. 1. pp. 59-64.

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@article{226ecd5fd94c4a3b967e4cb383ac761d,
title = "Analysis of threading dislocations in void shape controlled GaN re-grown on hexagonally patterned mask-less GaN",
author = "Muhammad Ali and A.E. Romanov and Sami Suihkonen and Olli Svensk and Sakari Sintonen and Markku Sopanen and Harri Lipsanen and V.N. Nevedomsky and N.A. Bert and M.A. Odnoblyudov and V.E. Bougrov",
year = "2012",
month = "4",
day = "1",
doi = "10.1016/j.jcrysgro.2012.01.047",
language = "English",
volume = "344",
pages = "59--64",
journal = "Journal of Crystal Growth",
issn = "0022-0248",
publisher = "Elsevier",
number = "1",

}

RIS - Download

TY - JOUR

T1 - Analysis of threading dislocations in void shape controlled GaN re-grown on hexagonally patterned mask-less GaN

AU - Ali, Muhammad

AU - Romanov, A.E.

AU - Suihkonen, Sami

AU - Svensk, Olli

AU - Sintonen, Sakari

AU - Sopanen, Markku

AU - Lipsanen, Harri

AU - Nevedomsky, V.N.

AU - Bert, N.A.

AU - Odnoblyudov, M.A.

AU - Bougrov, V.E.

PY - 2012/4/1

Y1 - 2012/4/1

U2 - 10.1016/j.jcrysgro.2012.01.047

DO - 10.1016/j.jcrysgro.2012.01.047

M3 - Article

VL - 344

SP - 59

EP - 64

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

SN - 0022-0248

IS - 1

ER -

ID: 802033