An inverse scattering technique for microwave imaging of binary objects

Ioannis T. Rekanos, T.D. Tsiboukis

    Research output: Contribution to journalArticleScientificpeer-review

    18 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1439-1441
    JournalIEEE Transactions on Microwave Theory and Techniques
    Volume50
    Issue number5
    Publication statusPublished - 2002
    MoE publication typeA1 Journal article-refereed

    Keywords

    • binary objects
    • finite element
    • iverse scattering
    • microwave imaging
    • sensitivity analysis

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