@article{3dc566a2168444f5a48dd9fdcb8982f0,
title = "An evalution of liquid phase epitaxial InGaAs/InAs heterostructures for infra-red devices using synchrotron x-ray topography",
keywords = "InGaAs, Phase epitaxial, x-ray topography, InGaAs, Phase epitaxial, x-ray topography, InGaAs, Phase epitaxial, x-ray topography",
author = "P.J. McNally and J. Curley and A. Krier and Y. Mao and J. Richardson and T. Tuomi and M. Taskinen and R. Rantam{\"a}ki and E. Prieur and A. Danilewsky",
year = "1998",
language = "English",
volume = "13",
pages = "345--349",
journal = "Semiconductor Science and Technology",
issn = "1361-6641",
publisher = "Institute of Physics Publishing",
}