An evaluation of liquid phase epitaxial InGaAs/GaAs heterostructures for infra-red devices using synchrotron x-ray topography

P.J. McNally, J. Curley, A. Krier, Y. Mao, J. Richardson, A. Danilewsky, B. Schropp, T. Tuomi, M. Taskinen, R. Rantamäki

    Research output: Working paperProfessional

    5 Citations (Scopus)
    Original languageEnglish
    Place of PublicationEspoo
    Pages867-868
    Publication statusPublished - 1997
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameHASYLAB-DESY Annual Report 1996 I

    Keywords

    • epitaxy
    • infra-red devices
    • x-ray topography

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