An Adaptive Two-Stage Approach to Classification of Surface Defects

J. Iivarinen, J. Rauhamaa, A. Visa

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publication10th Scandinavian Conference on Image Analysis, Lappeenranta, Finland, June 9-11, 1997
    Pagesvol. 1, s. 317-322
    Publication statusPublished - 1997
    MoE publication typeA4 Conference publication

    Keywords

    • fault detection
    • image segmentation
    • neural networks
    • self-organizing map
    • unsupervised segmentation

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