An accurate measurement of electron beam induced displacement cross sections for single-layer graphene

J.C. Meyer, F. Eder, S. Kurasch, V. Skakalova, J. Kotakoski, H.J. Park, Siegmar Roth, A. Chuvilin, S. Eyhusen, G. Benner, A.V. Krasheninnikov, U. Kaiser

Research output: Contribution to journalArticleScientificpeer-review

293 Citations (Scopus)
Original languageEnglish
JournalPhysical Review Letters
Publication statusPublished - 2012
MoE publication typeA1 Journal article-refereed


  • graphene

Cite this