AFM study of titanium dioxide thin films grown by ALE

M. Ritala, M. Leskelä, E. Nykänen, P. Soininen, L. Niinistö

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication12th International Vacuum Congress and 8th International Conference on Solid Surfaces, Haag, Hollanti, 1992
    Publication statusPublished - 1992
    MoE publication typeA4 Article in a conference publication

    Keywords

    • atomic force microscope (AFM)
    • atomic layer epitaxy (ALE)
    • thin films
    • titanium dioxide

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