Advanced Flaw Manufacturing and Crack Growth Control

M. Kemppainen, J. Pitkänen, Iikka Virkkunen, Hannu Hänninen

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of the Review of Progress in Quantitive Nondestructive Evaluation Conference
EditorsD.O. Thompson, D.E. Chimenti
PublisherAmerican Institute of Physics
Number of pages8
ISBN (Print)0-7354-0173-X
Publication statusPublished - 2004
MoE publication typeA4 Article in a conference publication
EventAnnual Review of Progress in Quantitative Nondestructive Evaluation - Green Bay, United States
Duration: 27 Jul 20031 Aug 2003
Conference number: 30


ConferenceAnnual Review of Progress in Quantitative Nondestructive Evaluation
Abbreviated titleQNDE
CountryUnited States
CityGreen Bay


  • crack growth
  • flaw manufacturing

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