Adhesion force measurement of a DPI size pharmaceutical particle by colloid probe atomic force microscopy

M. Tsukada, R. Irie, Y. Yonemochi, R. Noda, H. Kamiya, W. Watanabe, Esko I. Kauppinen

Research output: Contribution to journalArticleScientificpeer-review

50 Citations (Scopus)
Original languageEnglish
Pages (from-to)262-269
JournalPowder Technology
Volume141
Issue number3
DOIs
Publication statusPublished - 2004
MoE publication typeA1 Journal article-refereed

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