ADC characterization by an eigenvalue method

J.Q. Zhang, S. Ovaska

Research output: Working paper › Professional

1 Citation (Scopus)

Original language	English
Place of Publication	St. Paul, MN, USA
Pages	1198-1202
Publication status	Published - 1998
MoE publication type	D4 Published development or research report or study

Name	IEEE Instrumentation and Measurement Technology Conference (IMTC-98), St. Paul, MN, USA, May 18-21, 1998

Keywords

@techreport{a362245dc6d844619a5765986b7a7770,

title = "ADC characterization by an eigenvalue method",

keywords = "A/D converters, characterization, A/D converters, characterization, A/D converters, characterization",

author = "J.Q. Zhang and S. Ovaska",

year = "1998",

language = "English",

series = "IEEE Instrumentation and Measurement Technology Conference (IMTC-98), St. Paul, MN, USA, May 18-21, 1998",

pages = "1198--1202",

type = "WorkingPaper",

}

TY - UNPB

T1 - ADC characterization by an eigenvalue method

AU - Zhang, J.Q.

AU - Ovaska, S.

PY - 1998

Y1 - 1998

KW - A/D converters

KW - characterization

KW - A/D converters

KW - characterization

KW - A/D converters

KW - characterization

M3 - Working paper

T3 - IEEE Instrumentation and Measurement Technology Conference (IMTC-98), St. Paul, MN, USA, May 18-21, 1998

SP - 1198

EP - 1202

BT - ADC characterization by an eigenvalue method

CY - St. Paul, MN, USA

ER -