ADC characterization based on singular value decomposition

Seppo Ovaska, J.Q. Zhang

    Research output: Contribution to journalArticleScientificpeer-review

    20 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)138-143
    JournalIEEE Transactions on Instrumentation and Measurement
    Volume51
    Issue number1
    Publication statusPublished - 2002
    MoE publication typeA1 Journal article-refereed

    Keywords

    • analog-to-digital conversion
    • singular value decomposition

    Cite this