Adaptive Sub-Threshold Test Circuit

Matthew Turnquist, Erkka Laulainen, Jani Mäkipää, Hannu Tenhunen, Lauri Koskinen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publicationIEEE NASA/ESA Conference on Adaptive Hardware and Systems, San Francisco, CA, July 2009
    Publication statusPublished - 2009
    MoE publication typeA4 Article in a conference publication


    • low power
    • low voltage
    • sub-threshold
    • subthreshold,
    • weak inversion

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