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Achieving consistency of Young’s modulus determination from nanoscale deformation of low-k films

  • S. Nagao
  • , M. Fujikane
  • , N. Tymiak
  • , R. Nowak
    • Hiroshima University
    • Osaka University

    Research output: Contribution to journalArticleScientificpeer-review

    14 Citations (Scopus)
    Original languageEnglish
    Article number106104
    Number of pages3
    JournalJournal of Applied Physics
    Volume105
    Issue number10
    DOIs
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

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