Accurate determination of the layer thicnesses of a GaAs/AlAs superlattice
Research output: Working paper › Professional
Researchers
Research units
Details
| Original language | English |
|---|---|
| Place of Publication | Espoo |
| Pages | 20-22 |
| Publication status | Published - 1993 |
| MoE publication type | D4 Published development or research report or study |
Publication series
| Name | Optoelectronics Laboratory, Helsinki University of Technology |
|---|---|
| No. | TKK-F-C148 |
- semiconductor superlattices, X-ray diffraction
Research areas
ID: 5256578
