Accurate determination of the layer thicnesses of a GaAs/AlAs superlattice

Research output: Working paperProfessional

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Details

Original languageEnglish
Place of PublicationEspoo
Pages20-22
Publication statusPublished - 1993
MoE publication typeD4 Published development or research report or study

Publication series

NameOptoelectronics Laboratory, Helsinki University of Technology
No.TKK-F-C148

    Research areas

  • semiconductor superlattices, X-ray diffraction

ID: 5256578