Accurate determination of the layer thicnesses of a GaAs/AlAs superlattice

H.K. Lipsanen, M. Tuominen, V.M. Airaksinen

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationEspoo
    Pages20-22
    Publication statusPublished - 1993
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameOptoelectronics Laboratory, Helsinki University of Technology
    No.TKK-F-C148

    Keywords

    • semiconductor superlattices
    • X-ray diffraction

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