Accurate determination of the layer thicknesses of a GaAs/AlAs superlattice

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review


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Original languageEnglish
Title of host publication1st European Symposium on X-ray Topography and High Resolution Diffraction, Marseille, France, July 9-10, 1992
Publication statusPublished - 1992
MoE publication typeA4 Article in a conference publication

    Research areas

  • AlAs, GaAs, superlattices, X-ray diffraction

ID: 5022988