Accelerating synchrotron-based characterization of solar materials: Development of flyscan capability

Ashley E. Morishige, Hannu S. Laine, Mallory A. Jensen, Patricia X T Yen, Erin E. Looney, Stefan Vogt, Barry Lai, Hele Savin, Tonio Buonassisi

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

6 Citations (Scopus)


Synchrotron-based μ-XRF is a powerful tool to measure elemental distributions non-destructively with high spatial resolution and excellent sensitivity. Recently, we implemented on-the-fly data collection (flyscan) at Beamline 2-ID-D at the Advanced Photon Source at Argonne National Laboratory, making data acquisition faster than 300 ms per pixel practical. We show that flyscan mode at Beamline 2-ID-D enables (a) traditional elemental maps to be completed twenty times more quickly while maintaining reasonably high sensitivity, and (b) practical studies of materials with an order of magnitude lower total impurity concentration and sparser spatial density of impurities. We highlight opportunities for flyscan to enable qualitatively new forms of microscopy, leveraging the accelerated data-acquisition rate for multi-dimensional mapping.

Original languageEnglish
Title of host publication2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
Number of pages5
ISBN (Electronic)9781509027248
Publication statusPublished - 18 Nov 2016
MoE publication typeA4 Article in a conference publication
EventIEEE Photovoltaic Specialists Conference - Portland, United States
Duration: 5 Jun 201610 Jun 2016
Conference number: 43

Publication series

NameConference record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371


ConferenceIEEE Photovoltaic Specialists Conference
Abbreviated titlePVSC
Country/TerritoryUnited States


  • correlative microscopy
  • detection limit
  • flyscan
  • silicon
  • synchrotron
  • X-ray fluorescence


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