Accelerated light-induced degradation for detecting copper contamination in p-type silicon

Alessandro Inglese, Jeanette Lindroos, Hele Savin

Research output: Contribution to journalArticleScientificpeer-review

16 Citations (Scopus)
35 Downloads (Pure)
Original languageEnglish
JournalApplied Physics Letters
Volume107
Issue number5
DOIs
Publication statusPublished - 2015
MoE publication typeA1 Journal article-refereed

Keywords

  • accelerated light-induced degradation
  • copper defects
  • copper recovery

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