A simple method for on-wafer antenna gain measurement

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Researchers

Research units

Abstract

This paper presents a simple on-wafer antenna gain and radiation pattern measurement method in the probe station environment. It needs only the antenna under test (AUT) itself, a vector network analyzer, and a metal strip for the measurement procedure. The measurement and simulation gain results at E-band match very well in the resonance frequency band, with a difference less than 1 dB.

Details

Original languageEnglish
Title of host publication2017 Progress In Electromagnetics Research Symposium — Spring (PIERS)
Publication statusPublished - 2017
MoE publication typeA4 Article in a conference publication
EventProgress in Electromagnetics Research Symposium - St. Petersburg, Russian Federation
Duration: 22 May 201725 May 2017

Conference

ConferenceProgress in Electromagnetics Research Symposium
Abbreviated titlePIERS
CountryRussian Federation
CitySt. Petersburg
Period22/05/201725/05/2017

ID: 16403011