Abstract
This paper presents a simple on-wafer antenna gain and radiation pattern measurement method in the probe station environment. It needs only the antenna under test (AUT) itself, a vector network analyzer, and a metal strip for the measurement procedure. The measurement and simulation gain results at E-band match very well in the resonance frequency band, with a difference less than 1 dB.
Original language | English |
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Title of host publication | 2017 Progress In Electromagnetics Research Symposium — Spring (PIERS) |
Publisher | IEEE |
Pages | 1620 - 1624 |
ISBN (Electronic) | 978-1-5090-6269-0 |
DOIs | |
Publication status | Published - 2017 |
MoE publication type | A4 Article in a conference publication |
Event | Progress in Electromagnetics Research Symposium - St. Petersburg, Russian Federation Duration: 22 May 2017 → 25 May 2017 |
Conference
Conference | Progress in Electromagnetics Research Symposium |
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Abbreviated title | PIERS |
Country/Territory | Russian Federation |
City | St. Petersburg |
Period | 22/05/2017 → 25/05/2017 |
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