This paper presents a simple on-wafer antenna gain and radiation pattern measurement method in the probe station environment. It needs only the antenna under test (AUT) itself, a vector network analyzer, and a metal strip for the measurement procedure. The measurement and simulation gain results at E-band match very well in the resonance frequency band, with a difference less than 1 dB.
|Title of host publication||2017 Progress In Electromagnetics Research Symposium — Spring (PIERS)|
|Pages||1620 - 1624|
|Publication status||Published - 2017|
|MoE publication type||A4 Article in a conference publication|
|Event||Progress in Electromagnetics Research Symposium - St. Petersburg, Russian Federation|
Duration: 22 May 2017 → 25 May 2017
|Conference||Progress in Electromagnetics Research Symposium|
|Period||22/05/2017 → 25/05/2017|
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Jussi Ryynänen (Manager)Department of Electronics and Nanoengineering