A simple method for on-wafer antenna gain measurement

Jianfang Zheng; Juha Ala-Laurinaho; Antti Räisänen

doi:10.1109/PIERS.2017.8262009

A simple method for on-wafer antenna gain measurement

Jianfang Zheng, Juha Ala-Laurinaho, Antti Räisänen

Department of Electronics and Nanoengineering

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

7 Citations (Scopus)

Abstract

This paper presents a simple on-wafer antenna gain and radiation pattern measurement method in the probe station environment. It needs only the antenna under test (AUT) itself, a vector network analyzer, and a metal strip for the measurement procedure. The measurement and simulation gain results at E-band match very well in the resonance frequency band, with a difference less than 1 dB.

Original language	English
Title of host publication	2017 Progress In Electromagnetics Research Symposium — Spring (PIERS)
Publisher	IEEE
Pages	1620 - 1624
ISBN (Electronic)	978-1-5090-6269-0
DOIs	https://doi.org/10.1109/PIERS.2017.8262009
Publication status	Published - 2017
MoE publication type	A4 Conference publication
Event	Progress in Electromagnetics Research Symposium - St. Petersburg, Russian Federation Duration: 22 May 2017 → 25 May 2017

Conference

Conference	Progress in Electromagnetics Research Symposium
Abbreviated title	PIERS
Country/Territory	Russian Federation
City	St. Petersburg
Period	22/05/2017 → 25/05/2017

Access to Document

10.1109/PIERS.2017.8262009

Aalto Electronics-ICT
Ryynänen, J. (Manager)
Department of Electronics and Nanoengineering
Facility/equipment: Facility

Cite this

@inproceedings{b1ef5392e7494f428fbc2a25626580af,

title = "A simple method for on-wafer antenna gain measurement",

abstract = "This paper presents a simple on-wafer antenna gain and radiation pattern measurement method in the probe station environment. It needs only the antenna under test (AUT) itself, a vector network analyzer, and a metal strip for the measurement procedure. The measurement and simulation gain results at E-band match very well in the resonance frequency band, with a difference less than 1 dB.",

author = "Jianfang Zheng and Juha Ala-Laurinaho and Antti R{\"a}is{\"a}nen",

year = "2017",

doi = "10.1109/PIERS.2017.8262009",

language = "English",

pages = "1620 -- 1624",

booktitle = "2017 Progress In Electromagnetics Research Symposium — Spring (PIERS)",

publisher = "IEEE",

address = "United States",

note = "Progress in Electromagnetics Research Symposium, PIERS ; Conference date: 22-05-2017 Through 25-05-2017",

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AU - Zheng, Jianfang

AU - Ala-Laurinaho, Juha

AU - Räisänen, Antti

PY - 2017

Y1 - 2017

N2 - This paper presents a simple on-wafer antenna gain and radiation pattern measurement method in the probe station environment. It needs only the antenna under test (AUT) itself, a vector network analyzer, and a metal strip for the measurement procedure. The measurement and simulation gain results at E-band match very well in the resonance frequency band, with a difference less than 1 dB.

AB - This paper presents a simple on-wafer antenna gain and radiation pattern measurement method in the probe station environment. It needs only the antenna under test (AUT) itself, a vector network analyzer, and a metal strip for the measurement procedure. The measurement and simulation gain results at E-band match very well in the resonance frequency band, with a difference less than 1 dB.

U2 - 10.1109/PIERS.2017.8262009

DO - 10.1109/PIERS.2017.8262009

M3 - Conference article in proceedings

SP - 1620

EP - 1624

BT - 2017 Progress In Electromagnetics Research Symposium — Spring (PIERS)

PB - IEEE

T2 - Progress in Electromagnetics Research Symposium

Y2 - 22 May 2017 through 25 May 2017

ER -

A simple method for on-wafer antenna gain measurement

Abstract

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Aalto Electronics-ICT

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