A New Method to Measure the Thickness of a Thin Film by Total Internal Reflection Raman or Attenuated Total Reflection Infrared Spectroscopy

Antti Kivioja, Anna-Stiina Jääskeläinen, Tapani Vuorinen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationFACSS 2011, Reno, NV, USA, 2. - 7.10.2011
    EditorsDoug Gilman
    Place of PublicationSanta Fe, NM
    PublisherFACSS
    Pages141
    Publication statusPublished - 2011
    MoE publication typeA4 Article in a conference publication

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