A new method for measuring properties of unhomogeneous materials using a two-polarization forward-scattering measurement

A. Toropainen

    Research output: Working paperProfessional

    Original languageEnglish
    Pages257-260
    Publication statusPublished - 1993
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameIEEE MTT-S International Microwave Symposium, Atlanta, USA, 1993

    Keywords

    • microwave sensors
    • process industry
    • scattering

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