A new dual driver planar eddy current probe with dynamically controlled induction pattern

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Original languageEnglish
Pages (from-to)29-37
JournalNDT & E INTERNATIONAL
Volume70
Issue numberMarch
Publication statusPublished - 2015
MoE publication typeA1 Journal article-refereed

    Research areas

  • differential probe, dynamic inductionpattern, Eddy currentstesting, planar probe, reflection probe

ID: 1978514