A humidity-induced novel failure mechanism in power semiconductor diodes
- J. Leppänen*
- , G. Ross
- , V. Vuorinen
- , J. Ingman
- , J. Jormanainen
- , M. Paulasto-Kröckel
*Corresponding author for this work
- ABB Oy Drives
Research output: Contribution to journal › Article › Scientific › peer-review
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