A humidity-induced novel failure mechanism in power semiconductor diodes

J. Leppänen^*, G. Ross, V. Vuorinen, J. Ingman, J. Jormanainen, M. Paulasto-Kröckel

^*Corresponding author for this work

ABB Oy Drives

Research output: Contribution to journal › Article › Scientific › peer-review

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OtaNano - Nanofab
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Seitsonen, J. (Manager) & Rissanen, A. (Other)
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