A Feature Selection Methodology for Steganalysis

Yoan Miche, Patrick Bas, Amaury Lendasse, Christian Jutten, Olli Simula

    Research output: Contribution to journalArticleScientificpeer-review

    37 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)13-30
    JournalTraitement du Signal
    Volume26
    Issue number1
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

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