@article{72b46e042e1342c0a65a7ac1778fd966,
title = "A Defect Detection Scheme for Web Surface Inspection",
keywords = "co-occurrence matrix, defect detection, FPGA, self-organizing map, surface inspection, unsupervised segmentation, web inspection, VHDL, co-occurrence matrix, defect detection, FPGA, self-organizing map, surface inspection, unsupervised segmentation, web inspection, VHDL, co-occurrence matrix, defect detection, FPGA, self-organizing map, surface inspection, unsupervised segmentation, web inspection, VHDL",
author = "Jukka Iivarinen and Katriina Heikkinen and Juhani Rauhamaa and P. Vuorimaa and Ari Visa",
year = "2000",
doi = "10.1142/S0218001400000507",
language = "English",
volume = "14",
pages = "735--755",
journal = "International Journal of Pattern Recognition and Artificial Intelligence",
issn = "1793-6381",
publisher = "World Scientific",
number = "6",
}