A Defect Detection Scheme for Web Surface Inspection

J. Iivarinen, K. Heikkinen, J. Rauhamaa, P. Vuorimaa, A. Visa

    Research output: Contribution to journalArticleScientificpeer-review

    Original languageEnglish
    Pages (from-to)735-755
    JournalInternational Journal of Pattern Recognition and Artificial Intelligence
    Issue number6
    Publication statusPublished - 2000
    MoE publication typeA1 Journal article-refereed


    • co-occurrence matrix
    • defect detection
    • FPGA
    • self-organizing map
    • surface inspection
    • unsupervised segmentation
    • web inspection
    • VHDL

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