16-Term Error Model in Reciprocal Systems

Kimmo Silvonen, Krista Dahlberg, Tero Kiuru

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)3551-3558
JournalIEEE Transactions on Microwave Theory and Techniques
Volume60
Issue number11
DOIs
Publication statusPublished - 2012
MoE publication typeA1 Journal article-refereed

Keywords

  • 16-term error model
  • calibration
  • network analyzer (NWA)
  • on-wafer measurements
  • RF device modeling
  • scattering parameter measurement

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