Radiation detectors for instrumentation

Savin, Hele (Principal investigator)
Vähänissi, Ville (Project Member)
Yli-Koski, Marko (Project Member)
Modanese, Chiara (Project Member)
Bao, Yameng (Project Member)
Repo-Rontu, Päivikki (Project Member)
Budhraja, Vinay (Project Member)
Heinonen, Juha (Project Member)

1 Article

1 results

2020
Modeling Field-effect in Black Silicon and its Impact on Device Performance
Heinonen, J., Pasanen, T., Vähänissi, V., Juntunen, M. & Savin, H., 1 Apr 2020, In: IEEE Transactions on Electron Devices. 67, 4, p. 1645-1652 8 p., 9027860.
Research output: Contribution to journal › Article › Scientific › peer-review

Open Access
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10 Citations (Scopus)

252 Downloads (Pure)