Large-scale electronic structure techniques for advanced materials characterization

Makkonen, Ilja (Principal investigator)
Prozheeva, Vera (Project Member)
Härkönen, Jan (Project Member)
Simula, Kristoffer (Project Member)

Department of Applied Physics

16 Article
1 Conference contribution
1 Literature review

1 results

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2016
Review-Defect Identification with Positron Annihilation Spectroscopy in Narrow Band Gap Semiconductors
Slotte, J., Makkonen, I. & Tuomisto, F., 2016, In: ECS Journal of Solid State Science and Technology. 5, 4, p. P3166-P3171 6 p.
Research output: Contribution to journal › Literature review › peer-review