Elimination of contact losses in semiconductors through atomic-scale interface research and engineering

Savin, Hele (Principal investigator)
Isometsä, Joonas (Project Member)
Yli-Koski, Marko (Project Member)
Suihkonen, Sami (Project Member)
Vähänissi, Ville (Project Member)
Chen, Kexun (Project Member)

Department of Electronics and Nanoengineering

2 Article
1 Abstract

1 results

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2022

(poster) Reduction of defect density at Ge/Al2O3 interface using GeO2 interfacial layers
Isometsä, J., Fung, J., Pasanen, T., Liu, H., Leiviskä, O., Yli-Koski, M., Vähänissi, V. & Savin, H., 2022.
Research output: Contribution to conference › Abstract › Scientific › peer-review